| ○種別 (必須): | □ | 学術論文 (審査論文)
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| ○言語 (必須): | □ | 英語
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| ○招待 (推奨): |
| ○審査 (推奨): | □ | Peer Review
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| ○カテゴリ (推奨): | □ | 研究
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| ○共著種別 (推奨): | □ | 国内共著 (徳島大学内研究者と国内(学外)研究者との共同研究 (国外研究者を含まない))
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| ○学究種別 (推奨): | □ | 修士課程学生による研究報告
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| ○組織 (推奨): |
| ○著者 (必須): | 1. | (英) Takegami Kazuki (日) (読)
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| 2. | 林 裕晃
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| 3. | (英) Yamada Kenji (日) (読)
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| 4. | (英) Mihara Yoshiki (日) (読)
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| 5. | (英) Kimoto Natsumi (日) (読)
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| 6. | 金澤 裕樹 ([徳島大学.大学院医歯薬学研究部.保健学域.保健科学部門.放射線科学系.医用画像物理学]/徳島大学大学院医歯薬学研究部医用画像情報科学分野)
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| 7. | 東野 恒作
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| 8. | (英) Yamashita Kazuta (日) (読)
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| 9. | (英) Hayashi Fumio (日) (読)
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| 10. | (英) Okazaki Tohru (日) (読)
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| 11. | (英) Hashizume Takuya (日) (読)
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| 12. | (英) Kobayashi Ikuo (日) (読)
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| ○題名 (必須): | □ | (英) Entrance surface dose measurements using a small OSL dosimeter with a computed tomography scanner having 320 rows of detectors (日)
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| ○要約 (任意): | □ | (英) Entrance surface dose (ESD) measurements are important in X-ray computed tomography (CT) for examination, but in clinical settings it is difficult to measure ESDs because of a lack of suitable dosimeters. We focus on the capability of a small optically stimulated luminescence (OSL) dosimeter. The aim of this study is to propose a practical method for using an OSL dosimeter to measure the ESD when performing a CT examination. The small OSL dosimeter has an outer width of 10 mm; it is assumed that a partial dose may be measured because the slice thickness and helical pitch can be set to various values. To verify our method, we used a CT scanner having 320 rows of detectors and checked the consistencies of the ESDs measured using OSL dosimeters by comparing them with those measured using Gafchromic™ films. The films were calibrated using an ionization chamber on the basis of half-value layer estimation. On the other hand, the OSL dosimeter was appropriately calibrated using a practical calibration curve previously proposed by our group. The ESDs measured using the OSL dosimeters were in good agreement with the reference ESDs from the Gafchromic™ films. Using these data, we also estimated the uncertainty of ESDs measured with small OSL dosimeters. We concluded that a small OSL dosimeter can be considered suitable for measuring the ESD with an uncertainty of 30 % during CT examinations in which pitch factors below 1.000 are applied. (日)
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| ○キーワード (推奨): |
| ○発行所 (推奨): | □ | Springer
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| ○誌名 (必須): | □ | Radiological Physics and Technology ([社団法人 日本放射線技術学会]/日本医学物理学会)
(pISSN: 1865-0333, eISSN: 1865-0341)
| ○ISSN (任意): | □ | 1865-0341
ISSN: 1865-0333
(pISSN: 1865-0333, eISSN: 1865-0341) Title: Radiological physics and technologyTitle(ISO): Radiol Phys TechnolPublisher: Springer (NLM Catalog)
(医中誌Web)
(Scopus)
(CrossRef)
(Scopus information is found. [need login]) | [継承] |
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| ○巻 (必須): | □ | 10
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| ○号 (必須): | □ | 1
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| ○頁 (必須): | □ | 49 59
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| ○都市 (任意): |
| ○年月日 (必須): | □ | 西暦 2017年 3月 8日 (平成 29年 3月 8日)
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| ○URL (任意): |
| ○DOI (任意): | □ | 10.1007/s12194-016-0366-1 (→Scopusで検索)
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| ○PMID (任意): | □ | 27341805 (→Scopusで検索)
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| ○機関リポジトリ : | □ | 110814
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| ○備考 (任意): | 1. | (英) Article.PublicationTypeList.PublicationType: JOURNAL ARTICLE (日)
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| 2. | (英) KeywordList.Keyword: Computed tomography (日)
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| 3. | (英) KeywordList.Keyword: Entrance surface dose (日)
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| 4. | (英) KeywordList.Keyword: Gafchromic™ film (日)
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| 5. | (英) KeywordList.Keyword: OSL dosimeter (日)
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