〔閲覧〕【著作】([松英 達也]/[英 崇夫]/Ikeuchi Yasukazu/[日下 一也]/Sakata Osami/Alteration of internal stresses in SiO2/Cu/TiN thin films by synchrotron radiation due to heat treatment/The 8th International Symposium on Sputtering & Plasma Processes)
(英) Alteration of internal stresses in SiO2/Cu/TiN thin films by synchrotron radiation due to heat treatment (日)
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(英) The 8th International Symposium on Sputtering & Plasma Processes (日)(読)
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TF P1-13
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(英) Kanazawa (日)(読)
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西暦 2005年 6月 初日 (平成 17年 6月 初日)
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和文冊子 ●
Tatsuya Matsue, Takao Hanabusa, Yasukazu Ikeuchi, Kazuya KusakaandOsami Sakata : Alteration of internal stresses in SiO2/Cu/TiN thin films by synchrotron radiation due to heat treatment, The 8th International Symposium on Sputtering & Plasma Processes, (巻), (号), TF-P1-13, Kanazawa, June 2005.
欧文冊子 ●
Tatsuya Matsue, Takao Hanabusa, Yasukazu Ikeuchi, Kazuya KusakaandOsami Sakata : Alteration of internal stresses in SiO2/Cu/TiN thin films by synchrotron radiation due to heat treatment, The 8th International Symposium on Sputtering & Plasma Processes, (巻), (号), TF-P1-13, Kanazawa, June 2005.
関連情報
Number of session users = 9, LA = 0.57, Max(EID) = 389726, Max(EOID) = 1054233.